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2-4-inch wafer inspection machine

PRODUCTS > Semiconductor series > 2-4-inch wafer inspection machine

2-4-inch wafer inspection machine

Optical testing machine before cutting, suitable for 2-inch to 4-inch wafer

Main functions:


1. Suitable for optical detection before wafer cutting;


2. Automatically retrieve Wafer from CST, Mapping,Pre-aliner, Macroscopic inspection, feeding to semi-automatic manual table;


3. Wafer: 2 "wafer with a diameter of 50mm; 4”wafer   φ100mm, Thickness: 300-1100 μ m, warping < 0.5mm; Crystal round box: 2 "and 4" 25 slot Cassette;


4. Compatible with SEMI standard H-Cassette;


5. Conduct visual inspection with a microscope and manually adjust the magnification;


6. The manual table is adjustable on both XY axes;


7. Support AOI detection for scratches, ink leaks, oil stains, dirt, cracks, ink spots, and chipping edges;


8. Support SECS/GEM communication;


9. The film transmission mechanism is modular and can be used independently;


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